Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-02-28
2006-02-28
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07006943
ABSTRACT:
An integrated circuit such as a processor measures its own temperature with a temperature sensor. The measured temperature is compared to an upper limit value stored in the integrated circuit. An output terminal of the integrated circuit is asserted according to the comparison. In one mode of operation, the output terminal is asserted when the measured temperature is greater than the upper limit value and deasserted when the measured temperature goes below a lower limit value. A second output terminal is asserted when the temperature is above a second upper limit value, thereby indicating that temperature has exceeded a safe limit.
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Caldwell Dervinn
Maupin Patrick
Mitchell Charles W.
Advanced Micro Devices , Inc.
Barlow John
Lau Tung
Zagorin O'Brien Graham LLP
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