Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2007-08-07
2007-08-07
Chu, Gabriel (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S030000, C711S118000
Reexamination Certificate
active
10778945
ABSTRACT:
An apparatus and method for controlling and providing a robust, single entry cache memory is described in connection with an on-board cache memory integrated with a microprocessor. By implementing the single entry cache memory in a redundancy array of the cache memory, CPU debug procedures may proceed independently of the cache debug by disabling part of the cache memory and enabling a dedicated single entry cache in the redundancy array. Use of a cache redundancy array for the single entry cache imposes no area or latency penalties because the existing cache redundancy array already matches the latency of the cache.
REFERENCES:
patent: 5204836 (1993-04-01), Reed
patent: 5537665 (1996-07-01), Patel et al.
patent: 6011733 (2000-01-01), Fischer et al.
patent: 6021512 (2000-02-01), Lattimore et al.
S. Bhutani et al., “Processor Having a Coalescing Cache Disable Mode,” U.S Appl. No. 10/766,745, filed Jan. 27, 2004.
R. Heald et al., “A Third-Generation SPARC V9 64-b Microprocessor,” IEEE JSSC, Nov. 2000, pp. 1526-1538.
G. Konstadinidis et al., “Implementation of a Third-Generation 1.1GHz 64b Microprocessor,” 2002 IEEE International Solid-State Circuits Conference, Session 20/Microprocessors/20.3.
G. Konstadinidis et al., “Implementation of a Third-Generation 1.1GHz 64b Microprocessor,” 2002 IEEE Journal of Solid-State Circuits, vol. 37, No. 11, Nov. 2002, pp. 1461-1469.
B. McCarroll et al., “High-Speed CMOS Comparator for Use in an ADC,” IEEE JSSC, Feb. 1988, pp. 159-165.
D. Wendell et al., “A 4 MB On-Chip L2 Cache for a 90nm 1.6GHz 64 bit Microprocessor,” IEEE JSSC, Feb. 2004.
Kaushik Pradeep
Wendell Dennis
Bonura Tim
Chu Gabriel
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