Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-10-31
2009-02-03
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010
Reexamination Certificate
active
07486096
ABSTRACT:
In one embodiment, a test system tests a device under test (DUT). The DUT includes an internal test controller that executes built-in self-test (BIST programs. Built-in self-test programs include array-based automatic built-in self-test programs, discrete and combinational logic built-in self-test programs, and functional architecture verification programs (AVPs). An external manufacturing system test controller manages the internal test controller within the DUT and determines minimum operating voltage levels for a power supply input voltage that supplies the DUT. A logic simulator provides a modeling capability to further enhance the development of minimum voltage power supply input operational values for the DUT.
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Aikawa Makoto
Dhong Sang H.
Flachs Brian
Gervais Gilles
Johns Charles R.
Gerhardt Diana
International Business Machines - Corporation
Kahler Mark P
Nguyen Vinh P
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