Method and apparatus for testing semiconductor devices

Details Method and apparatus for testing semiconductor devices Method and apparatus for testing semiconductor devices

2005-03-08

2005-03-08

Moise, Emmanuel L. (Department: 2131)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S709000

Reexamination Certificate

active

06865698

ABSTRACT:
In a semiconductor device which outputs read-out data and a reference clock synchronized therewith for use in passing the data to other device, the generating timing of the reference clock and the generating timing of the data are compared by timing comparators11A and11B with first and second strobe pulses, and the logical values of the timing comparison result are compared by logic comparators12A and12B with first and second expected values. A logical condition decider13decides whether the combination of the logical comparison results satisfies a predetermined condition. When the predetermined condition is met, the decider13decides that the phase difference between the reference clock and the data is larger than a predetermined value, or that the duration of the data is longer than a predetermined time.

REFERENCES:
patent: 5579251 (1996-11-01), Sato
patent: 5621739 (1997-04-01), Sine et al.
patent: 5732047 (1998-03-01), Niijima
patent: 6016565 (2000-01-01), Miura
patent: 6421789 (2002-07-01), Ooishi
patent: 6486693 (2002-11-01), Conner et al.
patent: 6629274 (2003-09-01), Tripp et al.
patent: 6647521 (2003-11-01), Matsui
patent: 6693436 (2004-02-01), Nelson
patent: 20010052097 (2001-12-01), Miura
patent: 10 101899 (2001-11-01), None
patent: 08062296 (1996-03-01), None
patent: 11237454 (1999-08-01), None
patent: 990072577 (1999-09-01), None

Affiliated with

Also associated with

Rating

Method and apparatus for testing semiconductor devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing semiconductor devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing semiconductor devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3428646