Method and apparatus for testing integrated circuits

Details Method and apparatus for testing integrated circuits Method and apparatus for testing integrated circuits

2004-02-06

2008-10-14

Lau, Tung S (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000, C702S186000, C714S724000, C714S739000, C717S101000, C717S125000

Reexamination Certificate

active

07437261

ABSTRACT:
A distributed operating system for a semiconductor test system, such as automated test equipment (ATE), is described. The operating system includes a host operating system for enabling control of one or more site controllers by a system controller. One or more local operating systems, each associated with a site controller, enable control of one or more test modules by an associated site controller. Each test module performs testing on a corresponding device-under-test at a test site.

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