4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Leon Chen

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Method and apparatus for testing integrated circuits

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Measuring – testing – or signalling instruments – Measuring – regulating or indicating instrument – or casing – Electrical property
Design Patent

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Profile ID: LFUS-PAI-P-3160346

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