Method and apparatus for testing circuit modules

Details Method and apparatus for testing circuit modules Method and apparatus for testing circuit modules

2005-07-19

2005-07-19

Beausoliel, Robert (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S037000

Reexamination Certificate

active

06920582

ABSTRACT:
A method and apparatus for testing by sampling vectors circuit modules designated as channel models or as control modules and containing scan chains. Use is made of a test register which provides at least one control sampling mode signal for control modules and furthermore provides at least one channel sampling mode signal for channel modules. Channel modules and control modules can occur as circuit modules multiply with identical scan chains, enabling efficient testing in a manner that saves memory space. A logic is designed for the read-out of sampling output signals after testing of the scan chains via a read-out terminal unit of a test device, thus providing a comparison with desired sampling output signals for channel modules or for control modules in a comparator unit.

REFERENCES:
patent: 5961653 (1999-10-01), Kalter et al.
patent: 6661266 (2003-12-01), Variyam et al.
patent: 6662313 (2003-12-01), Swanson et al.
patent: 6691252 (2004-02-01), Hughes et al.

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