Method and apparatus for testing an integrated device's...

Details Method and apparatus for testing an integrated device's... Method and apparatus for testing an integrated device's...

2003-09-10

2009-02-24

Abraham, Esaw T (Department: 2112)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S731000, C714S744000, C714S707000

Reexamination Certificate

active

07496803

ABSTRACT:
A plurality of timing diagrams and different versions of circuits to test an integrated device in a test mode of operation. The invention allows for pulling in a strobe and eliminating the need for delay cells in strobe pads and a clock generation that facilitates varying the duty cycle for pulling in the strobe and pushing out the data.

REFERENCES:
patent: 7363563 (2008-04-01), Hissen et al.
patent: 2001/0014922 (2001-08-01), Kuge

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