Method and apparatus for testing a memory device

Details Method and apparatus for testing a memory device Method and apparatus for testing a memory device

2007-09-18

2008-12-23

Beausoliel, Robert (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S005110, C714S718000, C365S201000, C365S203000

Reexamination Certificate

active

07469360

ABSTRACT:
Disclosed is a method for testing a memory device with a long-term clock signal by automatically performing precharge only after activation. In this method, a signal for precharging the banks of the memory device is automatically generated only at the falling edge of an external signal when a signal for activating the banks is applied. Accordingly, the present invention ensures a stable test of the memory device, reducing the testing time.

REFERENCES:
patent: 6559669 (2003-05-01), Sugamoto et al.
patent: 2002/0066058 (2002-05-01), Sugamoto et al.

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