Method and apparatus for testing a memory device

Details Method and apparatus for testing a memory device Method and apparatus for testing a memory device

2008-04-01

2008-04-01

Yoha, Connie C. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S201000

Reexamination Certificate

active

11362318

ABSTRACT:
The extension sector enable signal RS_SEL is a test target control signal for switching a test target between ordinary sectors and redundant sectors. During the test period of redundant sectors, if the defective redundant sector signal RSECF is at a HIGH level (that is, the selected redundant sector is a defective sector), the compulsory signal FMATCH is brought to a HIGH level. The match signal MATCH is forcedly brought to a HIGH level (S22) in compliance with the compulsory signal FMATCH which is at a HIGH level (S21:T). And, verification (S2a) is skipped for the defective sectors, whereby the address signal for identifying the ordinary memory blocks may be utilized for identification of redundant memory blocks.

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