Method and apparatus for testing a memory device

Details Method and apparatus for testing a memory device Method and apparatus for testing a memory device

2008-04-01

2008-04-01

Yoha, Connie C. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S201000

Reexamination Certificate

active

07352638

ABSTRACT:
The extension sector enable signal RS_SEL is a test target control signal for switching a test target between ordinary sectors and redundant sectors. During the test period of redundant sectors, if the defective redundant sector signal RSECF is at a HIGH level (that is, the selected redundant sector is a defective sector), the compulsory signal FMATCH is brought to a HIGH level. The match signal MATCH is forcedly brought to a HIGH level (S22) in compliance with the compulsory signal FMATCH which is at a HIGH level (S21:T). And, verification (S2a) is skipped for the defective sectors, whereby the address signal for identifying the ordinary memory blocks may be utilized for identification of redundant memory blocks.

REFERENCES:
patent: 6288940 (2001-09-01), Kawamura
patent: 6295237 (2001-09-01), Pochmuller
patent: 6438044 (2002-08-01), Fukuda
patent: 6728910 (2004-04-01), Huang
patent: 2003/0072204 (2003-04-01), Shiga et al.
patent: 2003/0117886 (2003-06-01), Shiga et al.
patent: 2004/0109371 (2004-06-01), Tsukidate et al.
patent: 2001-195892 (2001-07-01), None
patent: 2003-077293 (2003-03-01), None
patent: 2003-257190 (2003-09-01), None
patent: 2004-102143 (2004-04-01), None
patent: 2004-103143 (2004-04-01), None

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