Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-06-21
2005-06-21
Nguyen, Viet Q. (Department: 2818)
Static information storage and retrieval
Read/write circuit
Testing
C365S049130, C714S030000, C714S718000, C714S719000
Reexamination Certificate
active
06909651
ABSTRACT:
In one embodiment, an array of content addressable memory (CAM) cells include a first plurality of CAM cells and a second plurality of CAM cells. The second plurality of CAM cells has a width sufficient to address a height of the array. A first plurality of CAM drivers are coupled to the array to drive the first plurality of CAM cells. The first plurality of CAM drivers prevent the first plurality of CAM cells from participating in a match when the array is in a test mode.
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Clark Lawrence T.
Miller Jay B.
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