Method and apparatus for test program execution control, and...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Details

C714S738000

Reexamination Certificate

active

06233701

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to a method and apparatus for controlling execution of testing for an information processing system and a computer-readable recording medium with a program for making a computer execute the method recorded therein.
BACKGROUND OF THE INVENTION
There has been described a “Test controlling method for an information processing system” in Japanese Patent Laid-Open Publication No. HEI 3-257538 as a method for enhancing the accuracy of a programming test in the information processing system. In this method, error factors for each test item from a result of tests are stored each time when the test is executed, an error rate for each error factor is obtained based on the error factor for each of the test items, a test item relating to execution of an error factor with a high error rate is detected, and testing for this test item is preferentially executed.
The conventional type of test program execution control apparatus as disclosed in the publication obtains an error rate from a test result obtained by collecting a number of execution times of test items and times of occurrence of error in the past, and preferentially executes the test item having a high error rate or increases the number of executions for the test item having a high error rate. Because of this, a tendency of errors varying in association with elapse of time is not reflected to control over execution of testing at a current point of time, and for this reason efficient testing appropriate for the current condition can not be executed.
Errors occurring in an information processing system vary in association with elapse of operating time. For example, in a case of software such as a firmware or a driver, although various types of errors arise at the time of starting the system operation, the software is stabilized in its quality in association with elapse of time, and occurrence of errors decreases. In contrast, in a case of hardware such as I/O or the like, it is anticipated that the error goes on increasing due to abrasion or dust with time. When a device in which error occurs many times is replaced with a device newly designed for having dealt with the errors, sometimes the errors may not occur at all.
As described in the above technology, if the method of preferentially executing testing for a test item having a high error rate in the past test result data is only employed, test efficiency may decrease because a test item currently having a low error rate may be preferentially executed or number of execution of testing for the test item may be unnecessarily increased.
If a test controlling method in which testing for a test item with a low error rate in the past test result data is not executed is employed, the error rate is reduced on the whole, but a test item in which an error is frequently occurring recently may not be executed, and there may arise a case in which an error that should have been detected is not detected at all.
SUMMARY OF THE INVENTION
It is an object of the present invention to provide, for the purpose of solving the problems as described above, a method and apparatus for executing efficient testing appropriate for the current condition of an information processing system from the errors occurred in the past testing and a computer-readable recording medium with a program for making a computer execute the method recorded therein.
In the invention, a result of testing for each test item for a test program executed for a specified information processing system is accumulated along with the test schedule, and, of the test results, an operating condition of the information processing system is determined based on the results of testing during only an arbitrary test period. Because of which, operating conditions for the arbitrary test period, namely at an arbitrary point of time during the test period can be acquired for in for the information processing system, and with this feature, efficient testing appropriate to the current condition of the information processing system can be realized.
In the invention, a number of times the testing for each test item is to be executed is determined according to a frequency of occurrence of errors, so that effective testing focusing on a critical function can be realized within a limited period of time.
In the invention, a condition in which an error occurs for each test item is determined, and an order of execution is decided in an order from a test item corresponding to the highest frequency of occurrence of errors to a test item corresponding to the lowest frequency of occurrence of errors according to the condition of occurrence of errors for each test item. Because of which testing from a test item having higher probability of detecting errors can efficiently be executed under the present condition of the information processing system.
In the invention, a condition in which an error occurs for each test item is determined as an, and an order of execution is decided in an order from a test item in which error occurs at a shortest interval to a test item in which error occurs at a longest interval according to the condition of occurrence of errors for each test item. Because of which, testing from a test item in which an error easily occurs can efficiently be realized.
In the invention, a condition in which an error occurs for each test item is determined as an operating condition, and an order of execution is decided in an order from a test item in which an error has occurred most recently to a test item in which an error has occurred most lately according to the condition of occurrence of errors for each test item. Because of which, it is possible to first recognize that the error having occurred is accurately dealt with.
In the invention, a condition in which an error occurs for each test item is determined, and a test item having a lower value of error occurrence frequency than a preset value is excluded from objects for execution according to the condition of occurrence of errors for each test item. Because of which, testing can efficiently be executed within a shorter period of time without substantially lowering the effect due to the test.
In the invention, a condition in which an error occurs for each test item is determined, and an order of execution is decided in a descending order from a test item corresponding to the highest error occurrence frequency or in an ascending order from a test item corresponding to an error occurring at the shortest interval, or in an ascending order from a test item corresponding to the last error according to the condition of occurrence of errors for each test item. Because of which, testing from a test item having higher probability of detecting errors can efficiently be executed when attention is paid to test items having a higher frequency of occurrence of errors, or testing from a test item having higher probability of occurrence of a errors when attention is paid to test items corresponding to an error occurring at a short interval, and checking whether countermeasures have been taken or not when attention is paid to the most recent occurrence of error becomes possible.
In the invention, there are provided steps of accumulating a result of testing for each test item for a test program executed for a specified information processing system along with the test schedule in the memory, specifying an arbitrary test period within the test schedule for each test item accumulated in the memory, determining operating condition of the information processing system based on the results of testing during the arbitrary test period, and deciding an order of execution of testing for each test item for the test program according to the determined operating condition, so that an operating condition for the arbitrary test period, namely at an arbitrary point time during the test period can be acquired for the information processing system. With this feature, efficient testing appropriate for a current condition of the information processing system can be realized.
In the invent

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