Method and apparatus for systematic and random variation and...

Static information storage and retrieval – Read/write circuit – Differential sensing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S205000, C365S207000

Reexamination Certificate

active

07405988

ABSTRACT:
Method and means for random or systematic mismatch compensation for a memory sensing system are disclosed. A sense amplifier includes a bulk voltage source to set the bulk of the sensing transistor to be a voltage different than the voltage driving the sensing transistor. For an NMOS sensing transistor, a triple well is used with the variable bulk voltage. Differential sense amplifiers with various offset compensation are included. Intentional offset creation for useful purpose is also included.

REFERENCES:
patent: 5646900 (1997-07-01), Tsukude et al.
patent: 6097641 (2000-08-01), Lu et al.
patent: 6282145 (2001-08-01), Tran et al.
patent: 6625057 (2003-09-01), Iwata
patent: 7183555 (2007-02-01), Jarron
patent: 2002/0089024 (2002-07-01), Iwata
patent: 2002/0094697 (2002-07-01), Leung et al.
patent: 2003/0103406 (2003-06-01), Tran et al.
patent: 2003/0151072 (2003-08-01), Leung et al.
patent: 2004/0114436 (2004-06-01), Hecht et al.
patent: 2004/0190329 (2004-09-01), Namekawa et al.
patent: 740307 (1996-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for systematic and random variation and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for systematic and random variation and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for systematic and random variation and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2815661

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.