Television – Special applications – Manufacturing
Reexamination Certificate
2011-06-28
2011-06-28
Rao, Andy S (Department: 2486)
Television
Special applications
Manufacturing
C348S126000
Reexamination Certificate
active
07969465
ABSTRACT:
The invention provides a substrate surface imaging method and apparatus that compensates for non-linear movement of the substrate surface during an imaging sequence. In one aspect of the invention, the imaging method and apparatus compensate for the non-linear substrate surface movement by adjusting the image receiver trigger points to correspond to image positions on the substrate surface. In another aspect, the invention provides synchronous imaging where the distance between each image position is determined by counting the number of stepper motor steps between image positions. In still another aspect, the invention provides for asynchronous substrate imaging by determining an image trigger time between each image position and using the image trigger time to trigger the receiver at the appropriate time to accurately image the substrate surface.
REFERENCES:
patent: 4441124 (1984-04-01), Heebner et al.
patent: 4449818 (1984-05-01), Yamaguchi et al.
patent: 4499595 (1985-02-01), Masaitis et al.
patent: 4772126 (1988-09-01), Allemand et al.
patent: 4893932 (1990-01-01), Knollenberg
patent: 4898471 (1990-02-01), Vaught et al.
patent: 4920385 (1990-04-01), Clarke et al.
patent: 4941980 (1990-07-01), Halavee et al.
patent: 4969748 (1990-11-01), Crowley et al.
patent: 5058178 (1991-10-01), Ray
patent: 5120034 (1992-06-01), VanEngelen et al.
patent: 5177559 (1993-01-01), Batchelder et al.
patent: 5233191 (1993-08-01), Noguchi et al.
patent: 5274434 (1993-12-01), Morioka et al.
patent: 5305391 (1994-04-01), Gomibuchi
patent: 5416594 (1995-05-01), Gross et al.
patent: 5463459 (1995-10-01), Morioka et al.
patent: 5465152 (1995-11-01), Bilodeau et al.
patent: 5479252 (1995-12-01), Worster et al.
patent: 5483138 (1996-01-01), Shmookler et al.
patent: 5486919 (1996-01-01), Tsuji et al.
patent: 5563798 (1996-10-01), Berken et al.
patent: 5637881 (1997-06-01), Burghard et al.
patent: 5644393 (1997-07-01), Nakamura et al.
patent: 5659172 (1997-08-01), Wagner et al.
patent: 5663569 (1997-09-01), Hayano
patent: 5694214 (1997-12-01), Watanabe et al.
patent: 5699447 (1997-12-01), Alumot et al.
patent: 5737072 (1998-04-01), Emery et al.
patent: 5748305 (1998-05-01), Shimono et al.
patent: 5774222 (1998-06-01), Maeda et al.
patent: 5781230 (1998-07-01), Nguyen et al.
patent: 5797317 (1998-08-01), Lahat et al.
patent: 5801824 (1998-09-01), Henley
patent: 5805278 (1998-09-01), Danko
patent: 5818576 (1998-10-01), Morishige et al.
patent: 5822213 (1998-10-01), Huynh
patent: 5834758 (1998-11-01), Trulson et al.
patent: 5861952 (1999-01-01), Tsuji et al.
patent: 5883710 (1999-03-01), Nikoonahad et al.
patent: 5889593 (1999-03-01), Bareket
patent: 5903342 (1999-05-01), Yatsugake et al.
patent: 5909276 (1999-06-01), Kinney et al.
patent: 5940175 (1999-08-01), Sun
patent: 6360005 (2002-03-01), Aloni et al.
patent: 6707544 (2004-03-01), Tsadka et al.
patent: 6813032 (2004-11-01), Hunter et al.
patent: 2003/0199097 (2003-10-01), Suzuki et al.
patent: 0 638 801 (1995-02-01), None
patent: 99/00661 (1999-01-01), None
patent: WO 99/56113 (1999-11-01), None
U.S. Appl. No. 09/173,669,Detection of Wafer Fragments in a Wafer Processing Apparatus, filed Oct. 15, 1998.
Batson Don T.
Hunter Reginald
Applied Materials Inc.
Patterson & Sheridan L.L.P.
Rao Andy S
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