Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2007-09-11
2007-09-11
Britt, Cynthia (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S042000, C365S201000
Reexamination Certificate
active
09548826
ABSTRACT:
A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.
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Charlton David E.
Prak Sovandy N.
Robinson Keith E.
Britt Cynthia
Micro)n Technology, Inc.
TraskBritt
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