Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2005-05-27
2008-11-25
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S049130, C365S185240, C365S205000
Reexamination Certificate
active
07457180
ABSTRACT:
An apparatus and method for forming a write-once non-volatile memory cell. A memory cell comprises a first and a second MOSFET, wherein the first MOSFET undergoes a process to modify the threshold voltage such that a modified threshold voltage represents a first stored logic value. By determining which one of the first and the second MOSFETS has an altered threshold voltage, the stored logic value is determinable. The threshold voltage of the first MOSFET is altered by supplying current through a MOSFET gate, causing a gate heating effect that results in a threshold voltage shift.
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Agere Systems Inc.
Nguyen Van-Thu
Priest & Goldstein PLLC
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