Method and apparatus for spatially resolved polarimetry

Optics: measuring and testing – By light interference – Having polarization

Reexamination Certificate

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Reexamination Certificate

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10765904

ABSTRACT:
A method and an apparatus for the spatially resolved polarimetric examination of an imaging beam pencil (1) generated by an associated pulsed radiation source (9). A first and a second photoelastic modulator (6a, 6b) and a polarization element (5) are introduced serially into the beam path of the beam pencil. A control unit (8) activates a first modulation oscillation of the first photoelastic modulator and a second modulation oscillation of the second photoelastic modulator and drives the radiation source for outputting a respective radiation pulse in a manner dependent on the oscillation state of the first photoelastic modulator and/or the second photoelastic modulator. A detector (4) detects the beam pencil coming from the polarization element in a spatially resolved manner.

REFERENCES:
patent: 5166752 (1992-11-01), Spanier et al.
patent: 5227623 (1993-07-01), Heffner
patent: 5298972 (1994-03-01), Heffner
patent: 5396329 (1995-03-01), Abramovitz
patent: 5521705 (1996-05-01), Oldenbourg et al.
patent: 5652673 (1997-07-01), Oakberg
patent: 5744721 (1998-04-01), Varnum
patent: 5841538 (1998-11-01), Schoeffler et al.
patent: 5886810 (1999-03-01), Siahpoushan et al.
patent: 5965874 (1999-10-01), Aso et al.
patent: 6204924 (2001-03-01), Cyr
patent: 6268914 (2001-07-01), Wang
patent: 6312373 (2001-11-01), Ichihara
patent: 6344898 (2002-02-01), Gemma et al.
patent: 6473176 (2002-10-01), Wang et al.
patent: 6473181 (2002-10-01), Oakberg
patent: 2002/0024673 (2002-02-01), Ouchi
patent: 101 09 929 (2001-11-01), None
patent: 0 396 409 (1990-11-01), None
patent: 0 439 127 (1991-07-01), None
patent: 11-142291 (1999-05-01), None
patent: WO 02/42728 (2002-05-01), None
patent: WO 03/028073 (2003-04-01), None
H. P. Povel et al, “Two-dimensional polarimeter with a charge-coupled-device image sensor and a piezoelastic modulator,” Applied Optics, Jul. 1, 1994, pp. 4254-4259, vol. 33, No. 19.
H.P. Povel et al., “Charge-coupled device image sensor as a demodulator in a 2-D polarimeter with a piezoelastic modulator,” Applied Optics, Mar. 10, 1990, pp. 1186-1191, vol. 29, No. 8.
D. Wróblewski et al., “Polarimetry of motional Stark effect and determination of current profiles DIII-D (invited),” Rev. Sci. Instrum. Oct. 1992, vol. 63, No. 10.
M. Totzeck et al., “Edge localization of subwavelength structures by use of polarization interferometry and extreme-value criteria,” Applied Optics, Dec. 1, 2000, vol. 39, No. 34.
M. Totzeck et al., “High-resolution inspection of 2D-microstructures using a multi-mode polarization microscopy,” Proceedings of the 2ndConference on Design and Fabrication, 2000, Japan.
D. Clarke and J. F. Grainger, “Polarized Light and Optical Measurement,” Pergamon Press, Oxford, 1971.
“Optical Shop Testing”, Edited by;Daniel Malacara, John Wiley & Sons, Inc., Second Edition, pp. 112-113, 1992, USA.
Michael I. Shribak et al, “Return-Path Polarimeter for two Dimensional Birefringence Distribution Measurement”, Jul. 1999, SPIE, pp. 144-145 and 148-149, vol. 3654, Denver Colorado.
S. Berezhna. et al, “Accuracy of Whole-Field Mapping by Jones Matrix Fourier Photopolarimeter”, 2000, Proceedings of the SPIE, pp. 81-89, vol. 4148.
Michael Totzeck, et al, “High-Resolution Measurement of 2D-Microstructures by Means of Jones-Matrix Microscopy”, Institut Für Tecnische Optik, Universität Stuttgart, Germany, pp. 1-4, no date.

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