Method and apparatus for semiconductor device repair with...

Details Method and apparatus for semiconductor device repair with... Method and apparatus for semiconductor device repair with...

2006-02-28

2006-02-28

Mai, Son (Department: 2827)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S189070

Reexamination Certificate

active

07006393

ABSTRACT:
An apparatus and method using a reduced number of fuses for enabling redundant memory blocks in a semiconductor memory is disclosed. In one embodiment, a redundancy selection module may be configured using selection fuses, wherein each selection fuse selects a pair of repair modules. In another embodiment, a redundancy selection module may be configured using selection fuses, wherein each selection fuse may select a power of two (i.e., 1, 2, 4, 8, etc.) number of repair modules. Each repair module includes fuses programmed with a selected address, such that the repair module may respond when an address input matches the selected address. However, the Least Significant Bit (LSB) is uninvolved in the address programming. Instead, the LSB is compared to the values of the selection fuses. As a result, repair modules select a redundant memory block based on a combination of the selected address comparison and the separate LSB comparison.

REFERENCES:
patent: 5387823 (1995-02-01), Asnizawa
patent: 5572470 (1996-11-01), McClure et al.
patent: 5691945 (1997-11-01), Liou et al.
patent: 5708619 (1998-01-01), Gillingham
patent: 5841712 (1998-11-01), Wendell et al.
patent: 5883842 (1999-03-01), Miyauchi
patent: 5920516 (1999-07-01), Gilliam et al.
patent: 6240033 (2001-05-01), Yang et al.
patent: 6285603 (2001-09-01), Ku et al.
patent: 6480429 (2002-11-01), Jones et al.
patent: 6538934 (2003-03-01), Sakata
patent: 6574156 (2003-06-01), Waller et al.

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