Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-11-01
2005-11-01
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06961914
ABSTRACT:
The present invention introduces novel methods generating training data for machine learning models that will be used for extraction. Specifically, experimental design is employed to select a set of training points that provide the best information. In one embodiment, the training point set is created by creating a critical input spanning set, adding training points from critical regions in the input space, and adding training points from frequently encountered profile cases. The training point set then used to train a machine learning built model such as a neural network or support vector machine that will extract electrical characteristics.
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Chatterjee Arindam
Teig Steven
Bowers Brandon
Cadence Design Systems Inc.
Siek Vuthe
Stattler, Johansen & Adeli, LLP.
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