Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
Reexamination Certificate
2006-02-07
2006-02-07
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
For transfer function determination
C324S527000, C714S733000
Reexamination Certificate
active
06996489
ABSTRACT:
An apparatus for sampling a power supply current value for performing frequency analysis of the power supply current flowing in an integrated circuit with a test signal applied to the integrated circuit has a power supply generating a prescribed supply of power for the integrated circuit (DUT: device under test), a current detection means for observing the power supply current value supplied from the power supply to the DUT, a test signal generation means for generating a prescribed test signal to be applied to an input/output terminal other than a power supply terminal of the DUT and for generating a test signal application signal during application of the test signal to the DUT, a sampling means for sampling the power supply current value signal, a sampling time determining means for instructing the sampling means with regard to the start and end timing for sampling, based on the test signal application signal, a sampling data storage means for storing data sampled by the sampling means, a Fourier transform means for performing a Fourier transformation calculation on the sampled data, and a main control means for outputting instructions to various other means and performing overall apparatus control.
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Sakaguchi, K. et al., “Fast Fault Detection by Analyzing the Power Spectrum of Supply Current” SEMI Technology Symposium 98:3-77 to 3-83.
Hoff Marc S.
Miller Craig Steven
NEC Electronics Corporation
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