Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-11-29
2005-11-29
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06971082
ABSTRACT:
A wiring designing method for electrically connecting a plurality of functional blocks on a semiconductor integrated circuit is disclosed, that comprises the steps of (a) obtaining a wiring branch point among the plurality of functional blocks, (b) obtaining a current density of the obtained wiring branch point, (c) determining whether or not the obtained current density exceeds a predetermined limit value, and (d) performing a process for decreasing a current density of a predetermined wiring portion that ends at the wiring branch portion whose current density exceeds the limit value corresponding to the determined result at the determining step (c).
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Japanese Office Action dated Mar. 11, 2003, with partial English translation.
Garbowski Leigh M.
McGinn IP Law Group PLLC
NEC Corporation
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