Method and apparatus for redundancy word line replacement in a s

Details Method and apparatus for redundancy word line replacement in a s Method and apparatus for redundancy word line replacement in a s

1994-09-19

1996-09-10

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Bad bit

365201, 365149, 371 103, G11C 700, G11C 2900

Patent

active

055552129

ABSTRACT:
A method and apparatus for redundancy word line replacement in a semiconductor device involves generating a control signal which causes the data on the data lines to be flipped when the bit pattern of the memory cells coupled to a redundant word line are complementary to the bit pattern of the memory cells of a defective word line which is being replaced by the redundant word line. During both read and write operations, a data flip control signal is input to a data flip circuit to control the state of the bit information.

REFERENCES:
patent: 4656610 (1987-04-01), Yoshida et al.
patent: 4866676 (1989-09-01), Crisp et al.
patent: 4918662 (1990-04-01), Kondo
patent: 5021944 (1991-06-01), Sasaki et al.
patent: 5083294 (1992-01-01), Okajima
patent: 5136543 (1992-08-01), Matsuda et al.
patent: 5218572 (1993-06-01), Lee et al.
patent: 5267204 (1993-11-01), Ashmore, Jr.
patent: 5289417 (1994-02-01), Ooishi et al.
patent: 5424898 (1995-06-01), Hagiwara et al.
"A 50-ns 16-Mb DRAM with a 10-ns Data Rate and On-Chip ECC," Kalter, Howard L., et al., IEEE Journal of Solid-State Circuits, vol. 25, No. 5, pp. 1118-1128 (Oct. 1990).

Affiliated with

Also associated with

Rating

Method and apparatus for redundancy word line replacement in a s does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for redundancy word line replacement in a s, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for redundancy word line replacement in a s will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1326146