Data processing: measuring – calibrating – or testing – Measurement system – Accelerometer
Reexamination Certificate
2005-06-21
2005-06-21
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Accelerometer
C340S539190, C340S904000, C600S507000, C607S019000
Reexamination Certificate
active
06909985
ABSTRACT:
The present invention is directed to recording changes associated with the acceleration of a structure. An exemplary embodiment includes an accelerometer array having at least one silicon beam type accelerometer, a nonvolatile memory, a clock timer, a programmable control unit operatively coupled to the accelerometer array, at least one non-volatile memory, and clock timer. The accelerometer array, the at least one non-volatile memory, the clock timer and the programmable control unit can be formed on a common semiconductor substrate (e.g., integrated), with the accelerometer array disposed in a central region.
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Burns Doane Swecker & Mathis L.L.P.
Le John
Lockheed Martin Corporation
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