Image analysis – Histogram processing – For setting a threshold
Patent
1983-01-03
1985-06-25
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
340700, 340721, 340729, 356 2, 356374, 356376, 364522, 382 22, 382 41, G06K 948, G09F 900
Patent
active
045258589
ABSTRACT:
A fully automatic method for rapidly and unambiguously interpreting fringe patterns, including those having branched fringes, is provided. The information from the fringe patterns processed by the method of the invention can be used in testing, surface characterization and inspection applications. Further processing of the information from the two-dimensional fringe patterns yields information from which the three-dimensional surface can be quantitatively reconstructed for further use such as for display, as in microscopy, or as input for computer-aided design and computer-aided manufacture. Apparatus for conducting the method of the invention is also provided.
REFERENCES:
patent: 3889107 (1975-06-01), Sutherland
patent: 4396903 (1983-08-01), Habicht et al.
Idesawa et al., "Scanning Moire Method and Automatic Measurement of 3-D Shapes", Applied Optics, vol. 16, No. 8, Aug. 1977, pp. 2152-2162.
Funnell, "Image Processing Applied to the Interactive Analysis of Interferometric Fringes", Applied Optics, vol. 20, No. 18, Sep. 1981, pp. 3245-3250.
Idesawa et al., "3-D Shape Input and Processing by Moire Technique", Proceedings 5th International Conf. on Pattern Recognition, vol. 2, IEEE (Cat. #80CH1499-3), 1980, pp. 1085-1090.
Cline Harvey E.
Holik Andrew S.
Lorensen William E.
Boudreau Leo H.
Davis Jr. James C.
General Electric Company
Magee Jr. James
Mancuso Joseph
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