Method and apparatus for quantifying tradeoffs for multiple...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

06957400

ABSTRACT:
To identify high quality design points in a circuit design, a plurality of design points is generated for the circuit. A subset of the design points is allocated to a design population. A cost is then determined for each allocated design point. From a subset of the allocated design points, a plurality of new design points is generated for the circuit. The cost for each new design point is then determined and each new design point having a cost that is the same or more favorable than the most favorable cost associated with the allocated design points is allocated to the design population. The design points allocated to the design population can then be displayed for selection of one of said allocated design points having desired performances of the circuit.

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