Method and apparatus for quantifying the timing error...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C702S079000

Reexamination Certificate

active

11066587

ABSTRACT:
In one embodiment, each of a plurality of stimulus signals is sequentially driven onto a number of stimulus signal paths. Each of the plurality of stimulus signals has a trigger edge. As each stimulus signal is driven onto the number of stimulus signal paths, a victim signal having a sensor edge is driven onto a victim signal path. After driving a corresponding stimulus and victim signal, the victim signal is sampled at or about a timing of the signal's sensor edge to thereby characterize the signal's sensor edge. The sensor edge characterizations corresponding to the different stimulus signals are then analyzed to quantify a timing error induced by crosstalk between the victim signal path and one or more of the stimulus signal paths.

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patent: 2006/0195806 (2006-08-01), Matsumiya

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