Method and apparatus for providing noise suppression in a...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000, C257S173000, C257S359000, C257S371000

Reexamination Certificate

active

07020857

ABSTRACT:
A method and apparatus for analyzing an integrated circuit design for pnpn structures which are likely to latchup or cause injection of noise into the substrate. Once qualifying pnpn structures are identified, the method and apparatus automatically inserts a noise and latchup suppression circuit of the designers' choice into the pnpn structure to eliminate the latchup and/or noise concerns.

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