Method and apparatus for production testing of self-refresh oper

Static information storage and retrieval – Read/write circuit – Data refresh

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365201, 36523003, G11C 700

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active

054503647

ABSTRACT:
A method and apparatus for testing the self-refresh operation of a dynamic memory part are provided in which an oscillator (140) is coupled to a self-refresh counter (142). The self-refresh counter (142) causes a refresh row address counter (144) to generate row addresses for self-refresh cycles. The refresh row address counter (144) is coupled to a self-refresh control circuit (148). The self-refresh control circuit (148) is operable to generate a signal indicating completion of a self-refresh cycle. The refresh row address counter (144) is also coupled to a multiplexer (146). The multiplexer (146) outputs row addresses from either the refresh row address counter (144) or those supplied externally for rows to be refreshed.

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