Method and apparatus for producing group III nitride

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate

Reexamination Certificate

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C257SE21108, C118S715000

Reexamination Certificate

active

07947577

ABSTRACT:
A method of producing a group III nitride such as aluminum nitride, comprising the step of reacting a group III halide gas such as aluminum trichloride gas with a nitrogen source gas such as ammonia gas in a growth chamber to grow a group III nitride on a substrate held in the growth chamber, wherein the method further comprises premixing together the group III halide gas and the nitrogen source gas to obtain a mixed gas and then introducing the mixed gas into the growth chamber without forming a deposit in the mixed gas substantially to be reacted each other.For the growth of a group III nitride such as an aluminum-based group III nitride by HVPE, there are provided a method of producing the group III nitride having as high quality as that obtained by the method of the prior art at a high yield and an apparatus used in the method.

REFERENCES:
patent: 5997649 (1999-12-01), Hillman
patent: 2002/0155713 (2002-10-01), Tsvetkov et al.
patent: 2005/0166835 (2005-08-01), Koukitsu et al.
patent: 2008/0063584 (2008-03-01), Koukitu et al.
patent: 0 979 882 (2000-02-01), None
patent: 0973882 (2000-02-01), None
patent: 1 494 269 (2005-01-01), None
patent: 2 727 693 (1996-06-01), None
patent: 272693 (1997-06-01), None
patent: 2415707 (2006-04-01), None
patent: 2 415 707 (2008-01-01), None
patent: 2001-508836 (2001-07-01), None
patent: 2002-316892 (2002-10-01), None
patent: 2003-212697 (2003-07-01), None
patent: 2003-303774 (2003-10-01), None
patent: 2006-73578 (2006-03-01), None
patent: 2006-114845 (2006-04-01), None
patent: WO9617973 (1996-06-01), None
patent: WO 96/17973 (1998-06-01), None
Kumagai et al., “Growth of thick AIN layers by hydride vapor-phase epitaxy”, 2005, Journal of Crystal Growth, vol. 281, No. 1, pp. 47-54.
Cai et al., “Modeling of gas phase and surface reactions in an aluminum nitride growth system”, 2006, Journal of Crystal Growth, vol. 293, No. 1, pp. 136-145.
Bliss et al., “Aluminum nitride substrate growth by halide vapor transport epitaxy”, 2003, Journal of Crystal Growth, vol. 250, No. 1-2, pp. 1-6.
European Patent Oficcee Search Rerport, dated by Dec. 16, 2010 in corresponding European Paten Applocation No. 0770292325.
Safvi et al., “Effect of reactor geometry and growth parameters on the uniformity and material properties of GaN/sapphire grown by hydride vapor-phase epitaxy”, 1997, Journal of Crystal Growth, vol. 182, No. 3-4, pp. 232-240.
Kumagai et al., “Growth of thick AIN layers by hydride vapor-phase epitaxy”, 2005,Journal of Crystal Growth, vol. 281, No. 1, pp. 62-67.
Egashira et al., “Cluster Size Determination in the Chemical Vapor Deposition of Aluminum Nitride”, J. Am. Ceram. Soc., pp. 2009-2016, vol. 77, No. 8, 1994.
Akinori Koukitu et al.; Thermodynamic analysis of AlGaN HYPE Growth; Journal of Crystal Growth; vol. 281; No. 1; Jul. 15, 2005; pp. 47-54.
D. Cai et al.; Modeling of gas phas and surface reactions in an aluminum nitride growth system; Journal of Crystal Growth; vol. 293; No. 1; Jul. 15, 2006; pp. 136-145.
D.F. Bliss et al.; Aluminum nitride substrate growth by halide vapor transport epitaxy, Journal of Crystal Growth, vol. 250; No. 1-2; Mar. 1, 2008; pp. 1-6.
European Search Report dated Dec. 16, 2010 issued in corresponding European Patent Application No. 07792325.8.
S.A. Safvi et al.; Effect of reactor geometry and growth parameters on the uniformity and material properties of GaN/sapphire growth by hydride vapor-phase epitaxy; Journal of Crystal Growth; vol. 182; No. 3-4, Dec. 1, 1997; pp. 233-240.
Yoshinao Kumagai et al.; Growth of thick AlN layers by hydride vapor-phase epitaxy; Journal of Crystal Growth; vol. 281; No. 1; Jul. 15, 2005; pp. 62-67.

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