Method and apparatus for processing semiconductor

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With measuring – sensing – detection or process control means

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C156S345250, C156S345260, C156S345270, C118S712000, C118S708000, C204S192100, C204S298010

Reexamination Certificate

active

07122096

ABSTRACT:
In a semiconductor processing apparatus including a process chamber, a sample stand for holding a sample in the process chamber, and a process gas supply unit for supplying a process gas to the process chamber, a plurality of samples of a lot are successively supplied to a process chamber to be successively processed in an intra-lot successive process. The apparatus includes a state sensor for detecting a state in the process chamber and an intra-lot variation pattern prediction unit for predicting, according to sensor data detected by the state sensor, intra-lot variation patterns of results of the intra-lot successive process. According to a result of the prediction by the intra-lot variation pattern prediction unit, the apparatus changes a process condition applied to a sample of the lot.

REFERENCES:
patent: 4927485 (1990-05-01), Cheng et al.
patent: 2003/0003607 (2003-01-01), Kagoshima et al.
patent: A-6-132251 (1994-05-01), None
patent: A-10-125660 (1998-05-01), None
patent: A-2001-267232 (2001-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for processing semiconductor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for processing semiconductor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for processing semiconductor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3691196

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.