Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2006-02-10
2010-02-02
Bali, Vikkram (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S261000, C382S265000
Reexamination Certificate
active
07657099
ABSTRACT:
A method and apparatus for processing a line pattern using a convolution kernel. An apparatus for processing a line pattern, the apparatus including a light source module radiating predetermined light and a camera module capturing an image of an object, onto which the light is radiated, the apparatus processing a line pattern included in the captured image, includes: a kernel learning unit determining a kernel shape and an optimal threshold value with respect to each vertical interval of the image using a simple line pattern formed at a predetermined location; a convolution application unit applying convolution to a captured test image using the determined kernel shape and optimal threshold value; and a region selection unit scanning each pixel column in the image, to which the convolution is applied, in a vertical direction, and setting pixel values of pixel groups other than a selected pixel group to 0 when a plurality of pixel groups having pixel values other than 0 exists.
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Bang Seok-won
Park Dong-ryeol
Bali Vikkram
Entezari Michelle
Samsung Electronics Co,. Ltd.
Staas & Halsey , LLP
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