Data processing: generic control systems or specific application – Generic control system – apparatus or process – Optimization or adaptive control
Reexamination Certificate
2008-05-06
2008-05-06
Von Buhr, M. N. (Department: 2125)
Data processing: generic control systems or specific application
Generic control system, apparatus or process
Optimization or adaptive control
C700S121000
Reexamination Certificate
active
07369905
ABSTRACT:
A method and apparatus are provided for a graded PECVD process that continuously modulates a set of flow and pressure conditions while the plasma power is turned on and a film is being deposited. A feedback mechanism specific to a give deposition recipe is used to generate, optimize and maintain a dynamic profile for a first input process parameter that produces a desired dynamic profile for a first output process parameter. An iterative approach produces a gradually converging series of dynamic profiles of an input profile parameter, which eventually succeeds in producing the desired dynamic profile for the first output process parameter of the graded PECVD process.
REFERENCES:
patent: 5408405 (1995-04-01), Mozumder et al.
patent: 5740033 (1998-04-01), Wassick et al.
patent: 6056781 (2000-05-01), Wassick et al.
patent: 6512991 (2003-01-01), Davis et al.
patent: 6913938 (2005-07-01), Shanmugasundram et al.
patent: 6943053 (2005-09-01), Oluseyi
patent: 7082345 (2006-07-01), Shanmugasundram et al.
patent: 7155301 (2006-12-01), Li et al.
patent: 2002/0199082 (2002-12-01), Shanmugasundram et al.
patent: 2003/0049390 (2003-03-01), Shanmugasundram et al.
patent: 2003/0190761 (2003-10-01), Oluseyi
patent: 2005/0026434 (2005-02-01), Huy et al.
patent: 2005/0289487 (2005-12-01), Li et al.
patent: 2006/0064188 (2006-03-01), Ushiku et al.
Advanced Micro Devices
Buhr M. N. Von
McDermott & Will & Emery
LandOfFree
Method and apparatus for pressure and plasma control during... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for pressure and plasma control during..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for pressure and plasma control during... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2767097