Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-06-13
2006-06-13
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07062747
ABSTRACT:
A method of preparing layout data of patterns formed in a scribe area. First, library data on which a plurality of patterns and arrangement limiting conditions of each pattern and arrangement importance of each pattern are registered is prepared. A pattern to be arranged in the scribe area is selected from the library data. Then, the selected pattern in the scribe area is arranged in accordance with the arrangement limiting conditions and arrangement importance of the selected pattern. In this method, it is not necessary to prepare many arrangement models, so that preparing time of layout data is shortened.
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patent: 2003/0027058 (2003-02-01), Kato
Horie Yukisada
Kurihara Takashi
Moriyama Takeo
Shibata Ryo
Dinh Paul
Tat Binh
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