Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-28
2005-06-28
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06912705
ABSTRACT:
A method performs an operation on physical design data stored as data objects in a database. Each data object represents a design figure of an integrated circuit (IC) design laid-out on an IC design area. The method includes (a) dividing the IC design area into a second plurality of sub-areas, (b) assigning an area property to each of the data objects, the area property indicating the sub-areas on which at least part of the corresponding design figure is to be located, (c) selecting a first data object, and (d) conducting an operation involving the first data object and a second data object involving selecting the second data object from a subset of data objects having an area property indicating a sub-area indicated by an area property of the first data object, and performing the operation on the first data object and the second data object.
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Garbowski Leigh M.
Gunnison McKay & Hodgson, L.L.P.
Sun Microsystems Inc.
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