Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-12-12
2006-12-12
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07149987
ABSTRACT:
One embodiment of the present invention provides a system that verifies whether a trace can be produced by a generator. A generator is defined as a finite state machine with a set of input and output signals. A trace is defined as a sequence of assignments of non-parametric input and output signals of the generator. The generator may contain parametric inputs to model non-determinism. The trace does not contain assignments of the parametric inputs. During operation, the system builds a data structure to determine if there exists a sequence of parametric input assignments that can match the non-parametric inputs and outputs of the generator with the ones specified in the trace.
REFERENCES:
patent: 6647513 (2003-11-01), Hekmatpour
patent: 7007251 (2006-02-01), Hekmatpour
patent: 2004/0006751 (2004-01-01), Kawabe et al.
patent: 2005/0102596 (2005-05-01), Hekmatpour
patent: 2006/0122834 (2006-06-01), Bennett
Kukula James H.
Zhu Yunshan
Dimyan Magid Y.
Dinh Paul
Park Vaughan & Fleming LLP
Synopsys Inc.
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