Method and apparatus for performing a circuit edit through the b

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

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257625, 257758, H01L 2348

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active

061507180

ABSTRACT:
A method and an apparatus for performing circuit edits through the back side of a flip-chip packaged integrated circuit die. In one embodiment, a circuit edit is achieved by exposing first and second circuit edit connection targets through a semiconductor substrate of the integrated circuit die from the back side. Next, an insulating layer is deposited over the first and second circuit edit connection targets and the exposed semiconductor substrate. Next, the circuit edit connection targets are re-exposed through the insulating layer and a conductor is deposited over the re-exposed circuit edit connection targets and the deposited insulating layer from the back side of the integrated circuit to couple together the circuit edit connection targets.

REFERENCES:
patent: 3976873 (1976-08-01), Bottka et al.
patent: 4144503 (1979-03-01), Itoh et al.
patent: 4273421 (1981-06-01), Gurtler
patent: 4480916 (1984-11-01), Bareket et al.
patent: 4503541 (1985-03-01), Weller et al.
patent: 4545111 (1985-10-01), Johnsin et al.
patent: 4583226 (1986-04-01), Liou
patent: 4661770 (1987-04-01), von Roos
patent: 4758092 (1988-07-01), Heinriche et al.
patent: 4759958 (1988-07-01), Namata et al.
patent: 4868068 (1989-09-01), Yamaguchi et al.
patent: 4961812 (1990-10-01), Baerg et al.
patent: 4980019 (1990-12-01), Baerg et al.
patent: 4995002 (1991-02-01), Yamada et al.
patent: 5037771 (1991-08-01), Lipp
patent: 5043297 (1991-08-01), Suzuki et al.
patent: 5097201 (1992-03-01), Henley
patent: 5164664 (1992-11-01), Solekner
patent: 5196362 (1993-03-01), Suzuki
patent: 5208178 (1993-05-01), Usami
patent: 5224022 (1993-06-01), Weigler et al.
patent: 5233310 (1993-08-01), Inoue
patent: 5246539 (1993-09-01), Canestrari
patent: 5332470 (1994-07-01), Crotti
patent: 5429994 (1995-07-01), Ishikawa
patent: 5483166 (1996-01-01), Carey et al.
patent: 5701666 (1997-12-01), DeHaven et al.
patent: 5805421 (1998-08-01), Livengood et al.
patent: 5832595 (1998-11-01), Maruyama et al.
patent: 5840627 (1998-11-01), Huggins
patent: 5872360 (1999-02-01), Paniccia et al.
patent: 5904486 (1999-05-01), Livengood et al.
patent: 5948217 (1999-09-01), Winer et al.
patent: 5976980 (1999-11-01), Livengood et al.
patent: 6001703 (1999-12-01), Winer et al.
Paul Winer, "IC Failure Analysis, E-Beam Tutorial," International Reliability and Physics Symposium, 1996.
Scott Silverman, "Laser Microchemical Technology Enables Real-Time Editing of First-Run Silicon", Solid State Technology, 1996.
Ann N. Campbell, "Fault Localization with the Focused Ion Beam (FIB) System", in Microelectronic Failure Analysis, ASM International, 1996.
Kurt J. Weingarten, Mark J. W. Rodwell, David M. Bloom, "Picosecond Optical sampling of GaAs Integrated Circuits,"IEEE Journal of Quantum Electronics, vol. 24, No. 2, Feb. 1988, pp. 198-220.
H. K. Heinrich, D. M. Bloom, Hemenway, "Noninvasive sheet charge density probe for integrated silicon devices,"1986 American Institute of Physics, Apr. 21, 1986, pp. 1066-1068.
Marvin Chester, Paul H. Wendland, "Electroabsorbtion Spectrum in Silicon,"Physical Review Letters, vol. 13, No. 6, Aug. 10, 1964 pp. 193-195.
Bernard Couillaud, Vittorio Fossati-Bellani, "Modellocked Lasers and Ultrashort Pulses,"Lasers & Applications, Jan. 1985, pp. 79-83, Feb. 1985, pp. 91-94.
Dr. Hansjoachim Hinkelmann, "Scanning Laser Microscopy,"Seminconductor International, Feb. 1985 (6 pages).
T. Nagatsuma, M. Shinagawa, M. Yaita, K. Takeya, "Electro-Optic Probing Technology for Ultrahigh-Speed IC Diagnosis,"1994 IEEE, pp. 1476-1483.
J. M. Wiesenfeld "Electro-optic sampling of high-speed devices and integrated circuits,"IBM J. Res. Develop. vol. 34, No. 2/3 Mar./May 1990, 141-161.
Heinrich, Harley Kent, Ph.D., "A noninvasive optical probe for detecting electrical signals in silicon integrated circuits,"Order No. 8723017, 1987.
H. K. Heinrich N. Pakdaman J.L. Prince, G. Jordy, M. Belaidi, R. Franch, D.C. Edelstein, "Optical detection of multibit logic signals at internal nodes in a flip-chip mounted silicon static random-access memory integrated circuit,"1992, American Vacuum Society, pp. 3109-3111.
Jacques I. Pankove,"Optical Processes in Semiconductors,"Dover Publications, Inc., 1971.
"Optical Sampling of GHz Charge Density Modulation In Silicon Bipolar Junction Transistors,"Electronics etters, Jul. 16, 1987, vol. 23, No. 15, pp.783-784.
A. A. Gutkin, F.E. Faradzhev, "Influence of the Polarization of Light on the Electroabsorbtion in Silicon,"Soviet Physics-Semiconductors, vol. 6, No. 9, Mar. 1973, pp. 1524-1527.
A. A. Gutkin, D. N. Nasledov, F.E. Faradzhev, "Influence of the orientation of the electric field on the polarization dependence of the electroabsorption in silicon,"Sov. Phys. Semicond., vol. 8, No. 6, Dec. 1974, pp. 781-782.
I.A. Merkulov, "Polarization effects in the electroabsorption in silicon,"Sov. Phys. Semicond., vol. 7, No. 11, May 1974, pp. 1465-1469.
A. Frova, P. Handler, F.A. Germano, D.E. Aspnes, "Electro-Absorption Effects at the Band Edges of Silicon and Germanium,"Physical Review, vol. 145, No. 2, May 13, 1966, pp. 575-583.
Richard A. Soref, Brian R. Bennett, "Electrooptical Effects in Silicon,"IEEE Journal of Quantum Electronics, vol. QE-23, No. 1, Jan. 1987, pp. 123-129.
H. K. Heinrich, N. Pakdaman, J.L. Prince, D.S. Kent, L.M. Cropp, "Picosecond Backside Optical Detection of Internal Signals in Flip-Chip Mounted Silicon VLSI Circuits,"Microelectronic Engineering 16, 1992, pp. 313-324.
"Measurement of Real-Time Digital Signals in a Silicon Bipolar Junction Transistor Using a Noninvasive Optical Probe,"Electronics Letters, vol. 22, No. 12, Jun. 5, 1986, pp. 650-652.
"Basic Photovoltaic Principles and Methods,"Solar Energy Research Institute, pp. 14-17.
M. Paniccia, V.R.M. Rao, W.M. Yee, "Optical Probing of Flip Chip Packaged Microprocessors,"Submitted for publication in the proceedings of 42 International conference of Electron, Ion and Photon Beam Technology and Nanofabrication, May 26-29, 1998.
Vladmir liberman, Vincent Malba, Anthony F. Bernhardt, "Integration of Vapor Deposited Polymide into a Multichip Module Packaging Process,"IEEE Transactions on Components, Packaging and Manfacturing Technology-Part B. vol. 20, No. 1, Feb. 1997.

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