Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-09-25
2007-09-25
Barlow, John (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C374S102000
Reexamination Certificate
active
11160601
ABSTRACT:
An apparatus for monitoring the temperature of an integrated circuit device includes a conductive wiring pattern formed on the integrated circuit device, extending into areas of the device to be monitored. A deterministic signal source is configured to generate a deterministic signal along the conductive wiring pattern, with one or more return paths tapped from selected locations along the pattern. A temperature change determination circuit is coupled to the one or more return paths and to a reference signal taken from the deterministic signal source. The circuit is configured to determine a delay between the reference signal and a delay signal traveling through at least a portion of the wiring pattern and a corresponding one of the return paths.
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Bueti Serafino
Courchesne Adam J.
Goodnow Kenneth J.
Norman Jason M.
Stanski Stanley B.
Barbee Manuel L.
Barlow John
Cantor & Colburn LLP
LeStrange Michael J.
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