Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2004-10-08
2008-11-18
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
Reexamination Certificate
active
07454316
ABSTRACT:
A system and method for projecting reliability to manage system functions includes an activity module which determines activity in the system. A reliability module interacts with the activity module to determine a reliability measurement for the module in real-time based upon the activity and measured operational quantities of the system. A management module manages actions of the system based upon the reliability measurement input from the reliability module. This may be to provide corrective action, to reallocate resources, increase reliability of the module, etc.
REFERENCES:
patent: 5497076 (1996-03-01), Kuo et al.
patent: 5847966 (1998-12-01), Uchino et al.
patent: 5999466 (1999-12-01), Marr et al.
patent: 6363515 (2002-03-01), Rajgopal et al.
patent: 6532570 (2003-03-01), Mau
patent: 6721447 (2004-04-01), Kim et al.
patent: 6771175 (2004-08-01), Eagle et al.
patent: 2005/0257078 (2005-11-01), Bose et al.
patent: 08-030493 (1996-02-01), None
patent: 2004-102130 (2004-02-01), None
U.S. Appl. No. 10/829,741, filed Apr. 22, 2004, Bose et al.
D. Brooks et al., New methodology for early-stage, microarchitecture-level power-performance analysis of microprocessors, IBM Journal, R & D, jVol. 47 No. 5/6, Sep./Nov. 2003; pp. 653-670.
K. Skadron et al., Temperature-Aware Michroarchitecture, Proc. 303th Ann. Int'l Symp on Computer Architecture, 2003, pp. 1-12.
J. Srinivasan, et al., RAMP: a model for reliability aware microprocessor design, IBM Confidential Research Report, Sep. 2003, pp. 1-25.
Assessing Product Reliability, Chapter 8, NIST/SEMATECH e-Handbook of Statistical Methods. In http://www.itl.nist.gov/div898/handbook/ 238 pages; Jun. 2003.
Bose Pradip
Rivers Jude A.
Srinivasan Jayanth
International Business Machines - Corporation
Jordan Kevin
Keusey, Tutunjian & & Bitetto, P.C.
Nghiem Michael P
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