Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-01-29
2008-01-29
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S067000, C702S180000, C702S182000, C702S189000, C348S180000, C348S192000, C398S202000, C398S033000, C375S224000, C375S226000
Reexamination Certificate
active
10919531
ABSTRACT:
A signal quality measuring method and apparatus in which a quality of a signal detected from an RF signal read out from a disk or a communications channel is measured by using eye pattern signals of the detected RF signals. Eye pattern signals representing time change of a waveform of the detected signal are generated and a signal quality value is generated based on an eye depth and/or an eye width measured from the eye pattern signals. A histogram of the eye pattern signals is used to identify a plurality of main level values which are used as a reference value in measuring the signal quality. Accordingly, signal characteristics in a high-density storage medium system or communication system may be accurately represented.
REFERENCES:
patent: 4034340 (1977-07-01), Sant'Agostino
patent: 6396601 (2002-05-01), Takara et al.
patent: 6718138 (2004-04-01), Sugawara
patent: 7174279 (2007-02-01), Conner
patent: 2002/0167693 (2002-11-01), Vrazel et al.
patent: 2002/0196510 (2002-12-01), Hietala et al.
patent: 2003/0016605 (2003-01-01), Tateyama et al.
patent: 2003/0117613 (2003-06-01), Audouin et al.
patent: 2005/0117916 (2005-06-01), Kropp et al.
patent: 09-288011 (1997-11-01), None
patent: 10-010176 (1998-01-01), None
patent: 10-233811 (1998-09-01), None
patent: 10-322401 (1998-12-01), None
patent: 2000-358015 (2000-12-01), None
Cho Eing-seob
Lee Jae-wook
Lee Jung-hyun
Park Hyun-soo
Ryu Eun-jin
Stein, McEwen & Bui LLP
Suglo Janet
Wachsman Hal
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