Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-01-29
2008-01-29
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S067000, C702S180000, C702S182000, C702S189000, C348S180000, C348S192000, C398S202000, C398S033000, C375S224000, C375S226000
Reexamination Certificate
active
07324903
ABSTRACT:
A signal quality measuring method and apparatus in which a quality of a signal detected from an RF signal read out from a disk or a communications channel is measured by using eye pattern signals of the detected RF signals. Eye pattern signals representing time change of a waveform of the detected signal are generated and a signal quality value is generated based on an eye depth and/or an eye width measured from the eye pattern signals. A histogram of the eye pattern signals is used to identify a plurality of main level values which are used as a reference value in measuring the signal quality. Accordingly, signal characteristics in a high-density storage medium system or communication system may be accurately represented.
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Cho Eing-seob
Lee Jae-Wook
Lee Jung-Hyun
Park Hyun-Soo
Ryu Eun-jin
Samsung Electronics Co,. Ltd.
Stein, McEwen & Bui LLP
Suglo Janet
Wachsman Hal
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