Optics: measuring and testing – Material strain analysis
Reexamination Certificate
2006-01-10
2006-01-10
Smith, Zandra V. (Department: 2877)
Optics: measuring and testing
Material strain analysis
C073S800000
Reexamination Certificate
active
06985213
ABSTRACT:
The present invention provides a method and apparatus mainly for measuring mechanical properties, electrical properties and transducer properties (e.g., electromechanical coupling constant) of piezoelectrics, wherein three measurement specimens of the same material and the same dimension, each having parallel planes, and two insertion plates of the same material and the same dimension, each having known mechanical properties, are stacked alternately, a load is applied to these measurement specimens and insertion plates via the measurement specimens located on both end sides, the displacements in the direction of application of the load are measured before and after application of the load, and an elastic constant of the measurement specimen is determined based on those displacements, and the measurement of the electromechanical coupling constant is applied to the piezoelectrics by using the same apparatus under short-and-open circuit conditions.
REFERENCES:
patent: 4574642 (1986-03-01), Fleischman
patent: 4864864 (1989-09-01), Yale et al.
patent: 5517861 (1996-05-01), Haas et al.
patent: 9-61324 (1997-03-01), None
patent: 2001-59803 (2001-03-01), None
An extract from “Year 2000 Annual Convention Discourse Papers” and the corresponding English translation, vol. II, Aug. 1, 2000.
Ichiki Masaaki
Kitahara Tokio
Ozaki Koichi
Tanaka Makoto
National Institute of Advanced Industrial Science and Technology
Smith Zandra V.
Valentin, II Juan D.
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