Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent
1987-04-29
1989-03-07
Nelms, David C.
Radiant energy
Photocells; circuits and apparatus
Optical or pre-photocell system
356376, G01B 1124
Patent
active
048108944
ABSTRACT:
A film thickness measuring method and device therefor which are free from drawbacks caused by errors in a sheet conveying system and an optical system of the device and the like. The optical system is moved over a sheet having a sheet member and a film formed thereon, whose thickness is to be measured, so that the deformation of the conveying system and the optical system is detected in advance. After taking the detection results into an account, the thickness measurement is carried out resulting in improving an accuracy thereof.
REFERENCES:
patent: 3518441 (1970-06-01), Selgin
patent: 4311392 (1982-01-01), Yazaki et al.
patent: 4532723 (1985-08-01), Kellie et al.
patent: 4730116 (1988-03-01), Ida et al.
Ariki Masayuki
Ida Yoshiaki
Nagao Toshishige
Allen Stephone B.
Mitsubishi Denki & Kabushiki Kaisha
Nelms David C.
LandOfFree
Method and apparatus for measuring film thickness using a second does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring film thickness using a second, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring film thickness using a second will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1670247