Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
Inventor
active
Film thickness measuring device with signal averaging to compens
Method and apparatus for measuring film thickness using a second
Method for measuring film thickness
Optical measuring device with alternately-activated detection
Sheet thickness measuring apparatus by optical scanning
No associations
LandOfFree
Toshishige Nagao does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Toshishige Nagao, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Toshishige Nagao will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-45936