Method and apparatus for measuring device mismatches

Details Method and apparatus for measuring device mismatches Method and apparatus for measuring device mismatches

2008-06-26

2009-11-24

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

07622942

ABSTRACT:
A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom to minimizes parasitic effects. The system can handle a large number of devices while still providing high spatial resolution of current measurements.

REFERENCES:
patent: 4638243 (1987-01-01), Chan
patent: 5181205 (1993-01-01), Kertis
patent: 6242936 (2001-06-01), Ho et al.
patent: 6496027 (2002-12-01), Sher et al.

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