Method and apparatus for mask pellicle adhesive residue...

Cleaning and liquid contact with solids – Processes – Combined

Reexamination Certificate

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C134S001000, C134S001300, C134S006000, C134S033000, C134S037000, C134S153000, C134S184000, C134S200000, C134S902000, C015S021100, C015S097100

Reexamination Certificate

active

08002899

ABSTRACT:
Aspects of the invention generally provide methods and apparatus for cleaning adhesive residual on a photomask substrate. In one embodiment, the apparatus includes a processing cell, a support assembly configured to receive a photomask substrate disposed thereon disposed in the processing cell, a protection head assembly disposed above and facing the support assembly, and a head actuator configured to control the elevation of the protection head assembly relative to an upper surface of the support assembly. A cleaning device is provided and positioned to interact with the photomask substrate disposed on the support assembly. In another embodiment, a method of cleaning a periphery region of a photomask substrate includes providing a photomask substrate having a periphery portion and a center portion disposed on a support assembly in a processing cell, lowering a protection cover disposed in the processing cell to cover the center portion of the photomask substrate, providing a brush in the processing cell to clean the periphery portion of the photomask substrate.

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