Method and apparatus for low temperature deposition of CVD and P

Semiconductor device manufacturing: process – Forming schottky junction – Using platinum group metal

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438584, 438685, 438935, 427 99, 4272555, 427251, 427569, 118723E, H01L 2120

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active

06140215&

ABSTRACT:
Method and apparatus are disclosed for low temperature deposition of CVD and PECVD films utilizing a gas-dispersing showerhead position within one inch of a rotating substrate. The showerhead is positioned a suitable distance below a gas-dispensing apparatus such as a steady stay flow of gas develops between the ring and showerhead. A cylindrical structure extends between the gas-dispersing ring and a showerhead to contain the gas over the showerhead yielding a small boundary layer over the substrate to ensure efficient uniform deposition of a film on a substrate surface. In the one embodiment of the present invention the showerhead is bias with RF energy such that it acts as an electrode to incite a plasma proximate with the substrate for PECVD. The cylinder is isolated from the showerhead such as by a quartz insulator ring to prevent ignition of a plasma within the cylinder, or alternatively, the cylinder is fabricated of quartz material. The RF showerhead utilizes small gas-dispersing holes to further prevent ignition of a plasma within the cylinder. The very small showerhead-to-substrate spacing and the efficient delivery of the plasma and reacting gases produces low temperature CVD and PECVD of films on the substrate.

REFERENCES:
patent: 4138306 (1979-02-01), Niwa
patent: 4151325 (1979-04-01), Welch
patent: 4178877 (1979-12-01), Kudo
patent: 4282267 (1981-08-01), Kuyel
patent: 4352834 (1982-10-01), Taketoshi et al.
patent: 4365587 (1982-12-01), Hirose et al.
patent: 4366208 (1982-12-01), Akai et al.
patent: 4410758 (1983-10-01), Grolitzer
patent: 4504518 (1985-03-01), Ovshinsky et al.
patent: 4532199 (1985-07-01), Ueno et al.
patent: 4535000 (1985-08-01), Gordon
patent: 4557943 (1985-12-01), Rosler et al.
patent: 4618542 (1986-10-01), Morita et al.
patent: 4657774 (1987-04-01), Satou et al.
patent: 4678679 (1987-07-01), Ovshinsky
patent: 4689093 (1987-08-01), Ishihara et al.
patent: 4691662 (1987-09-01), Roppel et al.
patent: 4702934 (1987-10-01), Ishihara et al.
patent: 4716048 (1987-12-01), Ishihara et al.
patent: 4717584 (1988-01-01), Aoki et al.
patent: 4717585 (1988-01-01), Ishihara et al.
patent: 4717586 (1988-01-01), Ishihara et al.
patent: 4718976 (1988-01-01), Fujimura
patent: 4726963 (1988-02-01), Ishihara et al.
patent: 4728528 (1988-03-01), Ishihara et al.
patent: 4759947 (1988-07-01), Ishihara et al.
patent: 4772486 (1988-09-01), Ishihara et al.
patent: 4774195 (1988-09-01), Beneking
patent: 4778692 (1988-10-01), Ishihara et al.
patent: 4784874 (1988-11-01), Ishihara et al.
patent: 4792378 (1988-12-01), Rose et al.
patent: 4798165 (1989-01-01), DeBoer et al.
patent: 4801468 (1989-01-01), Ishihara et al.
patent: 4803093 (1989-02-01), Ishihara et al.
patent: 4818560 (1989-04-01), Ishihara et al.
patent: 4818563 (1989-04-01), Ishihara et al.
patent: 4835005 (1989-05-01), Hirooka et al.
patent: 4844950 (1989-07-01), Saitoh et al.
patent: 4851302 (1989-07-01), Nakagawa et al.
patent: 4853251 (1989-08-01), Ishihara et al.
patent: 4869923 (1989-09-01), Yamazaki
patent: 4869924 (1989-09-01), Ito
patent: 4870030 (1989-09-01), Markunas et al.
patent: 4876983 (1989-10-01), Fukuda et al.
patent: 4885067 (1989-12-01), Doty
patent: 4886683 (1989-12-01), Hoke et al.
patent: 4888062 (1989-12-01), Nakagawa et al.
patent: 4888088 (1989-12-01), Slomowitz
patent: 4897709 (1990-01-01), Yokoyama et al.
patent: 4898118 (1990-02-01), Murakami et al.
patent: 4900694 (1990-02-01), Nakagawa
patent: 4908329 (1990-03-01), Kanai et al.
patent: 4908330 (1990-03-01), Arai et al.
patent: 4913929 (1990-04-01), Moslehi et al.
patent: 4914052 (1990-04-01), Kanai
patent: 4926229 (1990-05-01), Nakagawa et al.
patent: 4927786 (1990-05-01), Nishida
patent: 4937094 (1990-06-01), Doehler et al.
patent: 4946514 (1990-08-01), Nakagawa et al.
patent: 4951602 (1990-08-01), Kanai
patent: 4954397 (1990-09-01), Amada et al.
patent: 4957772 (1990-09-01), Saitoh et al.
patent: 4959106 (1990-09-01), Nakagawa et al.
patent: 4971832 (1990-11-01), Arai et al.
patent: 4977106 (1990-12-01), Smith
patent: 4987856 (1991-01-01), Hey et al.
patent: 4989544 (1991-02-01), Yoshikawa
patent: 4992305 (1991-02-01), Erbil
patent: 4992839 (1991-02-01), Shirai
patent: 4998503 (1991-03-01), Murakami et al.
patent: 5000113 (1991-03-01), Wang et al.
patent: 5002617 (1991-03-01), Kanai et al.
patent: 5002618 (1991-03-01), Kanai et al.
patent: 5002793 (1991-03-01), Arai
patent: 5002796 (1991-03-01), Nishida
patent: 5006180 (1991-04-01), Kanai et al.
patent: 5007971 (1991-04-01), Kanai et al.
patent: 5008726 (1991-04-01), Nakagawa et al.
patent: 5010842 (1991-04-01), Oda et al.
patent: 5017403 (1991-05-01), Pang et al.
patent: 5018479 (1991-05-01), Markunas et al.
patent: 5024706 (1991-06-01), Kanai et al.
patent: 5028488 (1991-07-01), Nakagawa et al.
patent: 5030475 (1991-07-01), Ackermann et al.
patent: 5037666 (1991-08-01), Mori
patent: 5039354 (1991-08-01), Nakagawa et al.
patent: 5052339 (1991-10-01), Vakerlis et al.
patent: 5061511 (1991-10-01), Saitoh et al.
patent: 5073232 (1991-12-01), Ohmi et al.
patent: 5085885 (1992-02-01), Foley et al.
patent: 5087542 (1992-02-01), Yamazaki et al.
patent: 5093149 (1992-03-01), Doehler et al.
patent: 5093150 (1992-03-01), Someno et al.
patent: 5099790 (1992-03-01), Kawakami
patent: 5100495 (1992-03-01), Ohmi et al.
patent: 5122431 (1992-06-01), Kodama et al.
patent: 5126169 (1992-06-01), Ishihara et al.
patent: 5130170 (1992-07-01), Kanai et al.
patent: 5139825 (1992-08-01), Gordon et al.
patent: 5151296 (1992-09-01), Tokunaga
patent: 5154135 (1992-10-01), Ishihara
patent: 5156820 (1992-10-01), Wang et al.
patent: 5173327 (1992-12-01), Sandhu et al.
patent: 5175017 (1992-12-01), Kobayashi et al.
patent: 5178904 (1993-01-01), Ishihara et al.
patent: 5178905 (1993-01-01), Kanai et al.
patent: 5180435 (1993-01-01), Markunas et al.
patent: 5192370 (1993-03-01), Oda
patent: 5213997 (1993-05-01), Ishihara et al.
patent: 5220181 (1993-06-01), Kanai et al.
patent: 5246881 (1993-09-01), Sandhu et al.
patent: 5248380 (1993-09-01), Tanaka
patent: 5256455 (1993-10-01), Numasawa
patent: 5260236 (1993-11-01), Petro et al.
patent: 5268034 (1993-12-01), Vukelic
patent: 5273588 (1993-12-01), Foster
patent: 5279857 (1994-01-01), Eichman et al.
patent: 5308655 (1994-05-01), Eichman et al.
patent: 5318654 (1994-06-01), Maruyama
patent: 5342471 (1994-08-01), Fukasawa
patent: 5342652 (1994-08-01), Foster et al.
patent: 5356476 (1994-10-01), Foster et al.
patent: 5370739 (1994-12-01), Foster et al.
patent: 5378501 (1995-01-01), Foster et al.
patent: 5396404 (1995-03-01), Akahori et al.
patent: 5416045 (1995-05-01), Kauffman et al.
patent: 5433787 (1995-07-01), Suzuki et al.
patent: 5434110 (1995-07-01), Foster et al.
patent: 5443647 (1995-08-01), Aucoin
patent: 5449410 (1995-09-01), Chang et al.
patent: 5453124 (1995-09-01), Moslehi
patent: 5610106 (1997-03-01), Foster et al.
patent: 5665640 (1997-09-01), Foster et al.
patent: 5716870 (1998-02-01), Foster et al.
patent: 5866213 (1999-02-01), Foster et al.
patent: 5908508 (1999-06-01), Vanell et al.
Lee, Hong, Fundamentals of Microelectronics Processing, McGraw-Hill, New York, pp. 383-387, 1990.
Kodama Atsushi; others, "Thin Film Forming Device" Abstracts of Japan, JP2217475, vol. 14, No. 522, 1990.
Kondo Hidekazu; others, "Method and Device for Forming Metallic Wiring" Abstracts of Japan, JP6158320, vol. 18, No. 490, 1994.
Kato Isamu; others, "Formation of Amorphous Silicon Film" Abstracts of Japan, JP2085368, vol. 14, No. 280, 1990.
Hirano Makoto, "Surface Treatment of Ornamental Parts" Abstracts of Japan, JP62161951, vol. 12, No. 5, 1988.
Pawlak & Zyrnicki, "Spectroscopic Investigations into Plasma Used for Nitriding Processes of Steel and Titanium", Thin Solid Films, 230 no date.
Shigenobu Shirai, "Production of Insulating Film" Abstract, JP60204880, vol. 10, No. 67, Mar. 15, 1986.
Sun et al., "Formation of TiN and SiO2 by Rapid Processing Using a Large Area Electron Beam", Jrnl of Vacuum Science&Tech.
Suzuki et al., "Planarized Deposition of High-Quality Silicon Dioxide Film by Photoassisted Plasma" CVD at 300 C Using Tetraethyl Orthosilicate 362 Jap Jrnl

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