Method and apparatus for locating coordinated starting points fo

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

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G06F 1560

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06077309&

ABSTRACT:
In accordance with the teachings of the present invention, an improved method and apparatus for automatically locating the coordinated starting points of a differential pair is provided. In one embodiment, a profile of obstacles is constructed, wherein the obstacles are proximately situated adjacent to a first and second endpoint of a differential pair. A pair of coordinated starting points are determined, corresponding to the first and second endpoints, using the constructed profile. The coordinated starting points are used for routing the differential pair of traces in a coordinated manner.

REFERENCES:
patent: 4484292 (1984-11-01), Hong
patent: 5375069 (1994-12-01), Satoh
patent: 5629838 (1997-05-01), Knight

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