4. Measuring and testing
  5. Hardness
  6. By penetrator or indentor

Ronald W. Armstrong

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Method and apparatus for line-modified asymmetric crystal topogr

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Thermal expansion driven indentation stress-strain system

Measuring and testing – Hardness – By penetrator or indentor
Patent

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Profile ID: LFUS-PAI-P-1612123

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