Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2008-09-16
2008-09-16
Geyer, Scott B. (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C324S765010, C250S494100
Reexamination Certificate
active
10792715
ABSTRACT:
In a method of irradiating an object with simulated solar radiation using a plurality of light sources, the object is irradiated with simulated solar radiation resulting from superimposed light rays from a plurality of light sources including light sources having different times at which light emission output reaches a peak.
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Hasebe Akio
Tokutake Nobuo
Geyer Scott B.
Nikmanesh Seahvosh J
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